[IEEE 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings - San Diego, CA, USA (25-27 Aug. 2003)] 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings (IEEE Cat. No.03TH8767) - Self-heating effect on device characteristics of GaN/AlGaN HEMTs: 2D Monte Carlo device simulation
Fujishiro, H.I., Mikami, N., Takei, T., Izawa, M., Moku, T., Ohtuka, K.Year:
2004
Language:
english
DOI:
10.1109/ISCSPC.2003.1354447
File:
PDF, 290 KB
english, 2004