[IEEE 2013 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2013 IEEE International Test...

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - On the generation of compact test sets

Kumar, Amit, Rajski, Janusz, Reddy, Sudhakar M., Wang, Chen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651914
File:
PDF, 163 KB
english, 2013
Conversion to is in progress
Conversion to is failed