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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - On the generation of compact test sets
Kumar, Amit, Rajski, Janusz, Reddy, Sudhakar M., Wang, ChenYear:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651914
File:
PDF, 163 KB
english, 2013