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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Layout-oriented simulation of non-destructive single event effects in CMOS IC blocks
Do, Enrico, Liberali, Valentino, Stabile, Alberto, Calligaro, CristianoYear:
2009
Language:
english
DOI:
10.1109/RADECS.2009.5994583
File:
PDF, 1.58 MB
english, 2009