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[IEEE Comput. Soc 23rd International Conference on Software Engineering. ICSE 2001 - Toronto, Ont., Canada (12-19 May 2001)] Proceedings of the 23rd International Conference on Software Engineering. ICSE 2001 - Incorporating varying test costs and fault severities into test case prioritization
Elbaum, S., Malishevsky, A., Rothermel, G.Year:
2001
Language:
english
DOI:
10.1109/ICSE.2001.919106
File:
PDF, 1.20 MB
english, 2001