[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Block-basis on-line BIST architecture for embedded SRAM using wordline and bitcell voltage optimal control
Yoshikawa, Masahiro, Okumura, Shunsuke, Nakata, Yohei, Kagiyama, Yuki, Kawaguchi, Hiroshi, Yoshimoto, MasahikoYear:
2011
Language:
english
DOI:
10.1109/ISQED.2011.5770744
File:
PDF, 707 KB
english, 2011