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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - At-speed functional verification of programmable devices
Bombieri, N., Fummi, F., Pravadelli, G.Year:
2004
Language:
english
DOI:
10.1109/DFTVS.2004.1347863
File:
PDF, 299 KB
english, 2004