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[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Bridging fault extraction from physical design data for manufacturing test development

Stroud, C.E., Emmert, J.M., Bailey, J.R., Chhor, K.S., Nikolic, D.
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Year:
2000
Language:
english
DOI:
10.1109/TEST.2000.894272
File:
PDF, 1.03 MB
english, 2000
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