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[IEEE ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - Santa Barbara, CA, USA (May 23-26, 2005)] Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - Evaluation of self-heating effects on an innovative SOI technology (�Venezia� process)
P. Villani, S. FavillaYear:
2005
Language:
english
DOI:
10.1109/ISPSD.2005.1487951
File:
PDF, 440 KB
english, 2005