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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA (2013.9.6-2013.9.13)] 2013 IEEE International Test Conference (ITC) - A test probe for TSV using resonant inductive coupling
Rashidzadeh, Rashid, Basith, IftekharYear:
2013
Language:
english
DOI:
10.1109/TEST.2013.6874619
File:
PDF, 1.51 MB
english, 2013