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[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Tutorial T6: Robust Design of Nanoscale Circuits in the Presence of Process Variations
Vrudhula, Sarma, Bhardwaj, SarveshYear:
2007
Language:
english
DOI:
10.1109/VLSID.2007.170
File:
PDF, 173 KB
english, 2007