[IEEE 1994 International Conference on Wafer Scale Integration (ICWSI) - San Francisco, CA, USA (19-21 Jan. 1994)] Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) - Quasi-analytical analysis of the broadband properties of multiconductor transmission lines on semiconducting substrates
Groteluschen, E., Dutta, L.S., Zaage, S.Year:
1994
Language:
english
DOI:
10.1109/ICWSI.1994.291230
File:
PDF, 484 KB
english, 1994