Electron spectroscopy of the interface carbon layer...

Journal of Electron Spectroscopy and Related Phenomena 2005 Vol. 142; Iss. 2

Electron spectroscopy of the interface carbon layer formation on the cleavage surfaces of the layered semiconductor In4Se3 crystals

P.V. Galiy, A.V. Musyanovych, T.M. Nenchuk
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Volume:
142
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.elspec.2004.10.005
File:
PDF, 184 KB
english, 2005
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