[IEEE 2013 IEEE 14th International Superconductive Electronics Conference (ISEC) - Cambridge, MA, USA (2013.07.7-2013.07.11)] 2013 IEEE 14th International Superconductive Electronics Conference (ISEC) - STM-SQUID microscopy using a fine probe
Watanabe, Norimichi, Miyato, Yuji, Itozaki, HideoYear:
2013
Language:
english
DOI:
10.1109/ISEC.2013.6604311
File:
PDF, 792 KB
english, 2013