[IEEE 2008 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (2008.01.28-2008.01.31)] 2008 Annual Reliability and Maintainability Symposium - Efficiently represent diverse system field usage in reliability testing
Sonnemans, Peter J.M., Balasubramanian, Aravindan, Kevrekedis, Kostas, Newby, Martin J.Year:
2008
Language:
english
DOI:
10.1109/RAMS.2008.4925783
File:
PDF, 327 KB
english, 2008