An X-ray photoelectron spectroscopy study of BaAl2S4 thin...

Journal of Electron Spectroscopy and Related Phenomena 2005 Vol. 148; Iss. 2

An X-ray photoelectron spectroscopy study of BaAl2S4 thin films

Philippe F. Smet, Jo E. Van Haecke, Roland L. Van Meirhaeghe, Dirk Poelman
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Volume:
148
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.elspec.2005.04.001
File:
PDF, 322 KB
english, 2005
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