[IEEE IEEE International Conference on Test, 2005. -...

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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Power-scan chain: design for analog testability

Zjajo, A., Henk Jan Bergveld,, Schuttert, R., Pineda de Gyvez, J.
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Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1583963
File:
PDF, 806 KB
english, 2005
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