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[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure analysis methodology for gate oxide breakdown induced by PID
David Zhu,, Loh, S. K, Neo, S.P., Ghim Boon Ang,Year:
2010
Language:
english
DOI:
10.1109/IPFA.2010.5532237
File:
PDF, 1015 KB
english, 2010