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[IEEE 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Smolenice, Slovakia (2006.10.16-2006.10.18)] 2006 International Conference on Advanced Semiconductor Devices and Microsystems - First results observed with test X-CT system using GaAs radiation detector working in single photon counting regime
Dubecky, F., Zat'ko, B., Frollo, I., Juras, J., Pribil, J., Jakubek, J., Mudron, J.Year:
2006
Language:
english
DOI:
10.1109/ASDAM.2006.331192
File:
PDF, 3.45 MB
english, 2006