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[IEEE Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Hsin Chu, Taiwan (2010.04.26-2010.04.28)] Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Electrical characterization of field-enhanced poly-Si nanowire SONOS memory
Wu, Chun-Yu, Liao, Ta-Chuan, Yu, Ming-H, Chen, Sheng-Kai, Tsai, Chung-Min, Cheng, Huang-ChungYear:
2010
Language:
english
DOI:
10.1109/VTSA.2010.5488948
File:
PDF, 1.02 MB
english, 2010