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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - New paradigm for signal paths in ATE pin electronics are needed for serialcom device testing
Shimanouchi, M.Year:
2002
Language:
english
DOI:
10.1109/TEST.2002.1041845
File:
PDF, 614 KB
english, 2002