[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulator
Bhattacharyya, A.B., Singh, D.N., Metha, R., Goswami, I.Year:
1995
Language:
english
DOI:
10.1109/IPFA.1995.487623
File:
PDF, 362 KB
english, 1995