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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Design challenges for 22nm CMOS and beyond
Borkar, ShekharYear:
2009
Language:
english
DOI:
10.1109/IEDM.2009.5424329
File:
PDF, 164 KB
english, 2009