![](/img/cover-not-exists.png)
Measurement of shell thickness in CdSe/CdS nanoparticles with X-ray absorption spectroscopy
A. Pietzsch, E. Suljoti, M. Nagasono, A. Föhlisch, W. WurthVolume:
166-167
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.elspec.2008.07.006
File:
PDF, 445 KB
english, 2008