[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - How Many Test Patterns are Useless?
Ferhani, Fran, Saxena, Nirmal R., McCluskey, Edward J., Nigh, PhilYear:
2008
Language:
english
DOI:
10.1109/VTS.2008.27
File:
PDF, 382 KB
english, 2008