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[IRE 1978 International Electron Devices Meeting - ()] 1978 International Electron Devices Meeting - A model of punchthrough current in short-channel MOSFETs, from low to high injection levels
Merckel, G., Gautier, J.Year:
1978
Language:
english
DOI:
10.1109/IEDM.1978.189458
File:
PDF, 89 KB
english, 1978