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[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - SIM comparison of dc resistance at 1 Ω, 1 MΩ, and 1 GΩ
Jarrett, D. G., Elmquist, R. E., Zhang, N. F., Tonina, A., Porfiri, M., Fernandes, J., Schechter, H., Izquierdo, D., Faverio, C., Slomovitz, D., Inglis, D., Wendler, K., Hernandez, F., Rodriguez, B.Year:
2008
Language:
english
DOI:
10.1109/CPEM.2008.4574695
File:
PDF, 220 KB
english, 2008