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[IEEE 1991 International Conference on Microelectronic Test Structures - Kyoto, Japan (18-20 March 1991)] Proceedings of the 1991 International Conference on Microelectronic Test Structures - Photoemission identification of emitter resistance for CMOS latch-up hysteresis
Ming-Jer Chen,, Jeng-Kuo Jeng,, Ping-Nan Tseng,, Nun-Sian Tsai,, Ching-Yuan Wu,Year:
1991
Language:
english
DOI:
10.1109/ICMTS.1990.161748
File:
PDF, 318 KB
english, 1991