[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - HEMT-SAW structures for chemical gas sensors in harsh environment
Ryger, I., Lalinsky, T., Vanko, G., Tomaska, M., Kostic, I., Hascik, S., Vallo, M.Year:
2010
Language:
english
DOI:
10.1109/ASDAM.2010.5666317
File:
PDF, 218 KB
english, 2010