Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy
F. Marchi, R. Dianoux, H.J.H. Smilde, P. Mur, F. Comin, J. ChevrierVolume:
66
Year:
2008
Language:
english
Pages:
10
DOI:
10.1016/j.elstat.2008.06.006
File:
PDF, 1.52 MB
english, 2008