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[IEEE 1999 Design Automation Conference - New Orleans, LA, USA (21-25 June 1999)] Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361) - A study in coverage-driven test generation
Benjamin, M., Geist, D., Hartman, A., Wolfsthal, Y., Mas, G., Smeets, R.Year:
1999
Language:
english
DOI:
10.1109/DAC.1999.782237
File:
PDF, 546 KB
english, 1999