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[IEEE 2008 International Conference on Intelligent Engineering Systems - Miami, FL, USA (2008.02.25-2008.02.29)] 2008 International Conference on Intelligent Engineering Systems - Vision Based Measurement System for Supporting the Deformation Analysis
Rovid, Andras, Varlaki, Peter, Hashimoto, TakeshiYear:
2008
Language:
english
DOI:
10.1109/INES.2008.4481297
File:
PDF, 468 KB
english, 2008