![](/img/cover-not-exists.png)
[IEEE 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009) - San Diego, CA, USA (2009.05.26-2009.05.29)] 2009 59th Electronic Components and Technology Conference - Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations
Celik, Emrah, Oterkus, Erkan, Guven, Ibrahim, Madenci, ErdoganYear:
2009
Language:
english
DOI:
10.1109/ECTC.2009.5074026
File:
PDF, 2.46 MB
english, 2009