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[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - A simple leakage current model for polycrystalline silicon nanowire thin-film transistors
Hongyu He,, Jin He,, Wanling Deng,, Hao Wang,, Yue Hu,, Xiaoan Zhu,, Xueren Zheng,Year:
2013
Language:
english
DOI:
10.1109/EDSSC.2013.6628090
File:
PDF, 1.08 MB
english, 2013