Study of breakdown effects in silicon multiguard structures

IEEE Transactions on Nuclear Science 1999 / Aug. Vol. 46; Iss. 4

Study of breakdown effects in silicon multiguard structures

Da Rold, M., Bacchetta, N., Bisello, D., Paccagnella, A., Dalla Betta, G.-F., Verzellesi, G., Militaru, O., Wheadon, R., Fuochi, P.G., Bozzi, C., Dell'Orso, R., Messineo, A., Tonelli, G., Verdini, P.G
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Volume:
46
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.785736
Date:
January, 1999
File:
PDF, 216 KB
english, 1999
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