[IEEE Comput. Soc 6th IEEE International On-Line Testing...

  • Main
  • [IEEE Comput. Soc 6th IEEE...

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Faster time-to-market, lower cost of development and test for standard analog IC

Migliavacca, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2000
Language:
english
DOI:
10.1109/OLT.2000.856630
File:
PDF, 174 KB
english, 2000
Conversion to is in progress
Conversion to is failed