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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Faster time-to-market, lower cost of development and test for standard analog IC
Migliavacca, P.Year:
2000
Language:
english
DOI:
10.1109/OLT.2000.856630
File:
PDF, 174 KB
english, 2000