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[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate
Agboton, A., DeFrance, N., Altuntas, P., Avramovic, V., Cutivet, A., Ouhachi, R., De Jaeger, J. C., Bouzid-Driad, S., Maher, H., Renvoise, M., Frijlink, P.Year:
2013
Language:
english
DOI:
10.1109/ESSDERC.2013.6818818
File:
PDF, 965 KB
english, 2013