A High-Density MTP Cell With Contact Coupling Gates by Pure CMOS Logic Process
Wu, Haw-Yun, Tsai, Cheng-Wei, Lien, Chiu-Wang, Chih, Y.-D., Lin, Chrong JungVolume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2011.2163612
Date:
October, 2011
File:
PDF, 341 KB
english, 2011