[IEEE 2013 25th International Conference on Microelectronics (ICM) - Beirut, Lebanon (2013.12.15-2013.12.18)] 2013 25th International Conference on Microelectronics (ICM) - No-reference quality assessment in global illumination algorithms based on SVM
Constantin, Joseph, Haddad, Soha, Constantin, Ibtissam, Bigand, Andre, Hamad, DenisYear:
2013
Language:
english
DOI:
10.1109/ICM.2013.6734963
File:
PDF, 741 KB
english, 2013