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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Semiconductor manufacturing process monitoring using built-in self-test for embedded memories

Schanstra, I., Lukita, D., van de Goor, A.J., Veelenturf, K., van Wijnen, P.J.
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Year:
1998
Language:
english
DOI:
10.1109/TEST.1998.743277
File:
PDF, 995 KB
english, 1998
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