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[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - Calibrating a sampling voltmeter using a binary Josephson system
van den Brom, Helko E., Houtzager, Ernest, Martina, Quincy E.V.N., Rietveld, GertYear:
2008
Language:
english
DOI:
10.1109/CPEM.2008.4574672
File:
PDF, 480 KB
english, 2008