[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - A Dual Grain Hit-Miss Detector for Large Die-Stacked DRAM Caches
El-Nacouzi, Michel, Atta, Islam, Papadopoulou, Myrto, Zebchuk, Jason, Jerger, Natalie Enright, Moshovos, AndreasYear:
2013
Language:
english
DOI:
10.7873/DATE.2013.032
File:
PDF, 364 KB
english, 2013