[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Fast and easy sample preparation with reduced curtaining artifacts using a P-FIB
Moreau, S., Bouchu, D., Audoit, G.Year:
2014
DOI:
10.1109/IPFA.2014.6898159
File:
PDF, 12.95 MB
2014