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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Characterization and modeling methodology for IC’s ESD susceptibility at system level using VF-TLP tester
Lacrampe, Nicolas, Caignet, Fabrice, Bafleur, Marise, Nolhier, Nicolas, Mauran, NicolasYear:
2007
Language:
english
DOI:
10.1109/EOSESD.2007.4401767
File:
PDF, 2.43 MB
english, 2007