Dose-Rate Upset Patterns in a 16K CMOS SRAM
Massengill, L. W., Diehl, S. E., Browning, J. S.Volume:
33
Year:
1986
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.1986.4334638
File:
PDF, 1.30 MB
english, 1986