Single event induced transients in I/O devices: a...

IEEE Transactions on Nuclear Science 1990 / Dec. Vol. 37; Iss. 6

Single event induced transients in I/O devices: a characterization

Newberry, D.M., Kaye, D.H., Soli, G.A.
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Volume:
37
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.101217
Date:
January, 1990
File:
PDF, 526 KB
english, 1990
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