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[IEEE Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Portland, OR (2002.09.30-2002.09.30)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Solving ESD protection latch-up guard ring issues during electrostatic discharge (ESD) events
Tremouilles,, Bafleur,, Bertrand,, Nolhier,, Mauran,, Lescouzeres,Year:
2003
Language:
english
DOI:
10.1109/BIPOL.2003.1274952
File:
PDF, 368 KB
english, 2003