[IEEE Comput. Soc. Press ETC 93 Third European Test...

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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Analysis of voltage forcing consequences during in-circuit testing

Sartori, M., Chiado Piat, A., Gallesio, A., Truzzi, C., Bonaria, L.
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Year:
1993
Language:
english
DOI:
10.1109/ETC.1993.246619
File:
PDF, 209 KB
english, 1993
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