![](/img/cover-not-exists.png)
[IEEE 2008 International Conference on Microelectronics - ICM - Sharjah, United Arab Emirates (2008.12.14-2008.12.17)] 2008 International Conference on Microelectronics - Custom formal verification technique for partial product reduction tree
Castellano, Marco, Baldrighi, Paola, Vacchi, Carla, Natuzzi, Mauro, Furlan, AlbertoYear:
2008
Language:
english
DOI:
10.1109/ICM.2008.5393541
File:
PDF, 321 KB
english, 2008