Degradation of insulators in Silicon Selective Epitaxial Growth (SEG) ambient
Bashir, R., Kim, S., Qadri, N., Jin, D., Neudeck, G.W., Denton, J.P., Yeric, G., Wu, K., Tasch, A.Volume:
16
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.406795
Date:
September, 1995
File:
PDF, 272 KB
english, 1995