[IEEE 2013 10th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) - Mexico City, Mexico (2013.09.30-2013.10.4)] 2013 10th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) - Finding scars in the cerebral cortex through the analysis of intensities in T2/MRI sequences
Avila-Mora, Ivonne M., Mendoza, Sonia, Garcia, Kimberly, Delgado-Hernandez, Rosa, Marrufo-Melendez, Oscar Rene, Juan-Orta, Daniel SanYear:
2013
Language:
english
DOI:
10.1109/ICEEE.2013.6676091
File:
PDF, 1.12 MB
english, 2013